Beilstein J. Nanotechnol.2021,12, 58–71, doi:10.3762/bjnano.12.5
determined.
Keywords: AFM force spectroscopy; composites; principlecomponentanalysis; structure–property correlation; van der Waals forces; Introduction
The mechanical properties of small volumes of materials can be measured using various atomic force microscopy (AFM) methods. The well-established force
is valid for the measurements that were performed with a single AFM probe. Under this condition, any given FDC can be classified in the kr/Fattr diagram. This treatment can, therefore, be considered a manually performed principlecomponentanalysis (mPCA).
Figure 3 shows the analogue results for bulk
component, allowing for a manual principlecomponentanalysis. Retransferring the results of the mPCA into the spatial domain allows for a chemical mapping of the sample that is independent from the parameters describing the mechanical behavior. This was shown for two different force spectroscopy methods
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Figure 1:
(a) Representation of tip–sample interactions. (b) Schematic drawing of a FDC. (c) FDCs (approach, ...